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Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link | |
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1 | 2000 | Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film | Hsieh, C. H.; Huang, Y. S.; Tiong, K. K.; Fan, C. W.; Chen, Y. F.; Chen, L. C.; Wu, J. J.; Chen, K. H. | Journal of Applied Physics 87(1):280 | |||
2 | 1999 | X-ray absorption of Si–C–N thin films: A comparison between crystalline and amorphous phases | Chang, Y. K.; Hsieh, H. H.; Pong, W. F.; Tsai, M. H.; Dann, T. E.; Chien, F. Z.; Tseng, P. K.; Chen, L. C.; Wei, S. L.; Chen, K. H. ; Wu, J. J.; Chen, Y. F. | Journal of Applied Physics 86(10), 5609-5613 |