Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/44046

Title:	Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film
Authors:	Hsieh, C. H. Huang, Y. S. Tiong, K. K. Fan, C. W. Chen, Y. F. Chen, L. C. Wu, J. J. Chen, K. H.
Issue Date:	2000-01
Relation:	Journal of Applied Physics 87(1):280
URI:	http://ir.sinica.edu.tw/handle/201000000A/44046
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0021-8979&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	http://dx.doi.org/10.1063/1.371856
Appears in Collections:	原子與分子科學研究所

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