http://ir.sinica.edu.tw/handle/201000000A/87720
題名: | Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis | 作者: | Lu, Yi-Ying Yu, Hsiao-Ching Wang, You-Xin Hung, Chih-Keng Chen, You-Ren Jhou, Jie Yen, Peter Tsung-Wen Hsu, Jui-Hung Sankar, Raman |
公開日期: | 2022-09-09 | 關聯: | Nanotechnology 33(48), 485702 | URI: | http://ir.sinica.edu.tw/handle/201000000A/87720 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT | URL: | http://dx.doi.org/10.1088/1361-6528/ac8bda |
顯示於: | 物理研究所 |
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