http://ir.sinica.edu.tw/handle/201000000A/87720| DC Field | Value | Language |
|---|---|---|
| dc.contributor | 物理研究所 | - |
| dc.contributor.author | Lu, Yi-Ying | - |
| dc.contributor.author | Yu, Hsiao-Ching | - |
| dc.contributor.author | Wang, You-Xin | - |
| dc.contributor.author | Hung, Chih-Keng | - |
| dc.contributor.author | Chen, You-Ren | - |
| dc.contributor.author | Jhou, Jie | - |
| dc.contributor.author | Yen, Peter Tsung-Wen | - |
| dc.contributor.author | Hsu, Jui-Hung | - |
| dc.contributor.author | Sankar, Raman | - |
| dc.date.accessioned | 2024-01-17T06:11:06Z | - |
| dc.date.available | 2024-01-17T06:11:06Z | - |
| dc.date.issued | 2022-09-09 | - |
| dc.identifier.issn | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT | - |
| dc.identifier.uri | http://ir.sinica.edu.tw/handle/201000000A/87720 | - |
| dc.description.sponsorship | 物理研究所 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | Nanotechnology 33(48), 485702 | - |
| dc.title | Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis | - |
| dc.type | journal article | - |
| dc.identifier.url | http://dx.doi.org/10.1088/1361-6528/ac8bda | - |
| dc.description.note | 已出版;[SCI];沒有審查制度 | - |
| item.grantfulltext | none | - |
| item.fulltext | no fulltext | - |
| item.languageiso639-1 | en | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.openairetype | journal article | - |
| item.cerifentitytype | Publications | - |
| crisitem.author.dept | Institute of Physics | - |
| crisitem.author.parentorg | Division of Mathematics and Physical Sciences | - |
| Appears in Collections: | 物理研究所 | |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.