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  1. Scholars Hub of the Academia Sinica
  2. 數理科學組
  3. 物理研究所
Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/87720
Title: Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis
Authors: Lu, Yi-Ying
Yu, Hsiao-Ching
Wang, You-Xin
Hung, Chih-Keng
Chen, You-Ren
Jhou, Jie
Yen, Peter Tsung-Wen
Hsu, Jui-Hung
Sankar, Raman 
Issue Date: 2022-09-09
Relation: Nanotechnology 33(48), 485702
URI: http://ir.sinica.edu.tw/handle/201000000A/87720
ISSN: http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL: http://dx.doi.org/10.1088/1361-6528/ac8bda
Appears in Collections:物理研究所

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