Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/87720

Title:	Optical determination of layered-materials InSe thickness via RGB contrast method and regression analysis
Authors:	Lu, Yi-Ying Yu, Hsiao-Ching Wang, You-Xin Hung, Chih-Keng Chen, You-Ren Jhou, Jie Yen, Peter Tsung-Wen Hsu, Jui-Hung Sankar, Raman
Issue Date:	2022-09-09
Relation:	Nanotechnology 33(48), 485702
URI:	http://ir.sinica.edu.tw/handle/201000000A/87720
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	http://dx.doi.org/10.1088/1361-6528/ac8bda
Appears in Collections:	物理研究所

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