Nondestructive characterization of the structural quality and thickness of large-area graphene on various substrates

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/44748

題名:	Nondestructive characterization of the structural quality and thickness of large-area graphene on various substrates
作者:	Y.L. Liu C.C. Yu K.T. Lin E.Y. Wang T.C. Yang H.L. Chen C.W. Chen C.K. Chang L.C. Chen K.H. Chen
公開日期:	2014
關聯:	ANALYTICAL CHEMISTRY 86, 7192
URI:	http://ir.sinica.edu.tw/handle/201000000A/44748
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2700&DestApp=JCR&RQ=IF_CAT_BOXPLOT
顯示於：	原子與分子科學研究所

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