Nondestructive characterization of the structural quality and thickness of large-area graphene on various substrates

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/44748

Title:	Nondestructive characterization of the structural quality and thickness of large-area graphene on various substrates
Authors:	Y.L. Liu C.C. Yu K.T. Lin E.Y. Wang T.C. Yang H.L. Chen C.W. Chen C.K. Chang L.C. Chen K.H. Chen
Issue Date:	2014
Relation:	ANALYTICAL CHEMISTRY 86, 7192
URI:	http://ir.sinica.edu.tw/handle/201000000A/44748
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2700&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	原子與分子科學研究所

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