X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/33074

題名:	X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering
作者:	Chen, Ying-Yu Yu, Bang-Ying Hsu, Mao-Feng Wang, Wei-Ben Lin, Wei-Chun Lin, Yu-Chin Jou, Jwo-Huei Shyue, Jing-Jong
公開日期:	2008
關聯:	Anal. Chem. 80 [2] 501-505
URI:	http://ir.sinica.edu.tw/handle/201000000A/33074
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2700&DestApp=JCR&RQ=IF_CAT_BOXPLOT
顯示於：	應用科學研究中心

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