X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33074

Title:	X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60 Sputtering
Authors:	Chen, Ying-Yu Yu, Bang-Ying Hsu, Mao-Feng Wang, Wei-Ben Lin, Wei-Chun Lin, Yu-Chin Jou, Jwo-Huei Shyue, Jing-Jong
Issue Date:	2008
Relation:	Anal. Chem. 80 [2] 501-505
URI:	http://ir.sinica.edu.tw/handle/201000000A/33074
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2700&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

Show full item record

Last Week
0

Last month
3

checked on Jan 2, 2023

Check