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Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link | |
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1 | 2000 | Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film | Hsieh, C. H.; Huang, Y. S.; Tiong, K. K.; Fan, C. W.; Chen, Y. F.; Chen, L. C.; Wu, J. J.; Chen, K. H. | Journal of Applied Physics 87(1):280 |