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Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link | |
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1 | 2011 | In Situ Vacuum Measurement of the Thickness Dependence of Electron Mobility in Naphthalenetetracarboxylic Diimide-Based Field-Effect Transistors | Liu, Shun-Wei; Lee, Chih-Chien; Wen, Je-Min; Chen, Chin-Ti | APPLIED PHYSICS LETTERS 98, 023306 |