| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
| 2009 | Dielectric response of AlSb from 0.7 to 5.0 eV determined by in situ ellipsometry | Jung, Y. W.; Ghong, T. H.; Byun, J. S.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Shin, S. H.; Song, J. D. | Appl. Phys. Lett. 94, 231913-231915 | | | |
| 2010 | InAs critical-point energies at 22 K from spectroscopic ellipsometry | Kim, T. J.; Yoon, J. J.; Hwang, S. Y.; Jung, Y. W.; Ghong, T. H.; Kim, Y. D.; Kim, H. J.; Chang, Y. -C. | Appl. Phys. Lett. 97, 171912 | | | |
| 2008 | Optical properties of In_{x}Al_{1-x}As alloy films | Yoon, J. J.; Ghong, T. H.; Byun, J. S.; Kim, Y D; Aspnes, D E; Kim, H; Chang, Y-C; Song, J. | APPLIED PHYSICS LETTERS 92, 151907 | | | |
