http://ir.sinica.edu.tw/handle/201000000A/33460
Title: | Dielectric response of AlSb from 0.7 to 5.0 eV determined by in situ ellipsometry | Authors: | Jung, Y. W. Ghong, T. H. Byun, J. S. Kim, Y. D. Kim, H. J. Chang, Y. C. Shin, S. H. Song, J. D. |
Issue Date: | 2009-06-01 | Relation: | Appl. Phys. Lett. 94, 231913-231915 | URI: | http://ir.sinica.edu.tw/handle/201000000A/33460 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-6951&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
Appears in Collections: | 應用科學研究中心 |
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