InAs critical-point energies at 22 K from spectroscopic ellipsometry

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33518

Title:	InAs critical-point energies at 22 K from spectroscopic ellipsometry
Authors:	Kim, T. J. Yoon, J. J. Hwang, S. Y. Jung, Y. W. Ghong, T. H. Kim, Y. D. Kim, H. J. Chang, Y. -C.
Issue Date:	2010-10-01
Relation:	Appl. Phys. Lett. 97, 171912
URI:	http://ir.sinica.edu.tw/handle/201000000A/33518
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-6951&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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