A Complete Bayesian Degradation Analysis Based on Inverse Gaussian Processes

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/90387

Title:	A Complete Bayesian Degradation Analysis Based on Inverse Gaussian Processes
Authors:	Fan, T. H. Dong, Y. S. Peng, C. Y.
Issue Date:	2024-03
Relation:	IEEE TRANSACTIONS ON RELIABILITY 73(1), 536-548
URI:	http://ir.sinica.edu.tw/handle/201000000A/90387
Appears in Collections:	統計科學研究所

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