Multiparametric Characterization of Heterogeneous Soft Materials using Contact Point Detection-Based Atomic Force Microscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/81013

Title:	Multiparametric Characterization of Heterogeneous Soft Materials using Contact Point Detection-Based Atomic Force Microscopy
Authors:	Chih-Wen Yang Ching-Hsiu Chen Ren-Feng Ding Hsien-Shun Liao Ing-Shouh Hwang
Issue Date:	2020-04-23
Relation:	APPLIED SURFACE SCIENCE 522, 146423
URI:	http://ir.sinica.edu.tw/handle/201000000A/81013
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0169-4332&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	https://doi.org/10.1016/j.apsusc.2020.146423
Appears in Collections:	物理研究所

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