http://ir.sinica.edu.tw/handle/201000000A/48268
Title: | Scanning Photoemission Spectromicroscopic study of 4 nm ultrathin SiO3.4 protrusions probe-induced on native SiO2 layer |
Authors: | Devan, R. S. Gao, S. -Y. Lin, Y. -R. Cheng, S. -R. Hsu, C. -E. Chen, C. -H. Shiu, H. -W. Liou, Y. Ma, Y. -R. |
Issue Date: | 2011-08-01 |
Relation: | MICROSCOPY AND MICROANALYSIS17, 944-949 |
URI: | http://ir.sinica.edu.tw/handle/201000000A/48268 |
Appears in Collections: | 物理研究所 |
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