Scanning Photoemission Spectromicroscopic study of 4 nm ultrathin SiO3.4 protrusions probe-induced on native SiO2 layer

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/48268

Title:	Scanning Photoemission Spectromicroscopic study of 4 nm ultrathin SiO3.4 protrusions probe-induced on native SiO2 layer
Authors:	Devan, R. S. Gao, S. -Y. Lin, Y. -R. Cheng, S. -R. Hsu, C. -E. Chen, C. -H. Shiu, H. -W. Liou, Y. Ma, Y. -R.
Issue Date:	2011-08-01
Relation:	MICROSCOPY AND MICROANALYSIS17, 944-949
URI:	http://ir.sinica.edu.tw/handle/201000000A/48268
Appears in Collections:	物理研究所

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