Determining the film thickness and probing the interface structure with characteristic scanning tunneling spectroscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/47367

Title:	Determining the film thickness and probing the interface structure with characteristic scanning tunneling spectroscopy
Authors:	Lu, S. M. Shih, H. C. Jiang, C. L. Su, W. B. Chang, C. S. Tsong, Tien T.
Issue Date:	2006
Relation:	Chin. J. Phys. 44, 309
URI:	http://ir.sinica.edu.tw/handle/201000000A/47367
Appears in Collections:	物理研究所

Show full item record

checked on Dec 31, 2022

Check