Nanoscale doping fluctuation resolved by electrostatic force microscopy via the effect of surface band bending

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/46597

Title:	Nanoscale doping fluctuation resolved by electrostatic force microscopy via the effect of surface band bending
Authors:	Chin, Shu-Cheng Chang, Yuan-Chih Chang, Chia-Seng Woon, Wei-Yen Lin, Li-Te Tao, Hung-Jan
Issue Date:	2008
Relation:	Applied Physics Letters 93, 253102
URI:	http://ir.sinica.edu.tw/handle/201000000A/46597
Appears in Collections:	物理研究所

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