Exchange bias in sputtered FM/BiFeO3 thin films

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/45746

Title:	Exchange bias in sputtered FM/BiFeO3 thin films
Authors:	Chang, H. W. Yuan, F. T. Shih, C. W Li, W. L. Chen, P. H. Chang, W. C. Jen, S. U.
Issue Date:	2012-04-01
Relation:	JOURNAL OF APPLIED PHYSICS111, 07B105-107
URI:	http://ir.sinica.edu.tw/handle/201000000A/45746
Appears in Collections:	物理研究所

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