High-Sensitivity Imaging in Liquid by Torsional Resonance Mode Atomic Force Microscopy utilizing Lorentz Force Actuation

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/45637

題名:	High-Sensitivity Imaging in Liquid by Torsional Resonance Mode Atomic Force Microscopy utilizing Lorentz Force Actuation
作者:	Ren-Feng Ding Shih-Hsiu Lai Hsien-Shun Liao Wei-Chiao Lai Kuang-Yuh Huang Chia-Seng Chang Ing-Shouh Hwang Chih-Wen Yang
公開日期:	2014-09-07
會議:	18th International Microscopy Congress (Prague, Czech Republic : The Czechoslovak Microscopy Society The International Federation of Societies for Microscopy Academy of Science of the Czech Republic)
URI:	http://ir.sinica.edu.tw/handle/201000000A/45637
URL:	http://www.microscopy.cz/abstracts/2107.pdf
顯示於：	物理研究所

顯示文件完整紀錄

上周
0

上個月

checked on 2023/1/3

檢查