X-ray photoelectron spectroscopic investigation on Fe geometrical sites of iron nitride thin films

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/44962

題名:	X-ray photoelectron spectroscopic investigation on Fe geometrical sites of iron nitride thin films
作者:	Y. C. Lin J. Y. Hong C. N. Yen S. Y. Tong M. J. Tung H. W. Shiu C. H. Chen Minn-Tsong Lin
公開日期:	2015-02
關聯:	Jpn. J. Appl. Phys. 54, 033002/1-4
URI:	http://ir.sinica.edu.tw/handle/201000000A/44962
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0021-4922&DestApp=JCR&RQ=IF_CAT_BOXPLOT
顯示於：	原子與分子科學研究所

顯示文件完整紀錄

上周
0

上個月
0

checked on 2023/1/3

檢查

TAIR相關文章