X-ray photoelectron spectroscopic investigation on Fe geometrical sites of iron nitride thin films

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/44962

Title:	X-ray photoelectron spectroscopic investigation on Fe geometrical sites of iron nitride thin films
Authors:	Y. C. Lin J. Y. Hong C. N. Yen S. Y. Tong M. J. Tung H. W. Shiu C. H. Chen Minn-Tsong Lin
Issue Date:	2015-02
Relation:	Jpn. J. Appl. Phys. 54, 033002/1-4
URI:	http://ir.sinica.edu.tw/handle/201000000A/44962
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0021-4922&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	原子與分子科學研究所

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