Correlating defect density with carrier mobility in large-scaled graphene films: Raman spectral signatures for the estimation of defect density

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/43936

題名:	Correlating defect density with carrier mobility in large-scaled graphene films: Raman spectral signatures for the estimation of defect density
作者:	Hwang, J. Y. Kuo, C. C. Chen, L. C. Chen, K. H.
公開日期:	2010
關聯:	NANOTECHNOLOGY 21, 465705
URI:	http://ir.sinica.edu.tw/handle/201000000A/43936
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT
顯示於：	原子與分子科學研究所

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