http://ir.sinica.edu.tw/handle/201000000A/43936
Title: | Correlating defect density with carrier mobility in large-scaled graphene films: Raman spectral signatures for the estimation of defect density | Authors: | Hwang, J. Y. Kuo, C. C. Chen, L. C. Chen, K. H. |
Issue Date: | 2010 | Relation: | NANOTECHNOLOGY 21, 465705 | URI: | http://ir.sinica.edu.tw/handle/201000000A/43936 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0957-4484&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
Appears in Collections: | 原子與分子科學研究所 |
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