Enhancing Flash Memory Reliability by Jointly Considering Write-back Pattern and Block Endurance

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/40900

Title:	Enhancing Flash Memory Reliability by Jointly Considering Write-back Pattern and Block Endurance
Authors:	Tseng-Yi Chen Yuan-Hao Chang Yuan-Hung Kuan Ming-Chang Yang Yu-Ming Chang Pi-Cheng Hsiu
Issue Date:	2018-10
Relation:	ACM Transactions on Design Automation of Electronic Systems (TODAES) 23(5), 64
URI:	http://ir.sinica.edu.tw/handle/201000000A/40900
Appears in Collections:	資訊科學研究所

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