Study of Charge Diffusion at the Carbon Nanotube-SiO2 Interface by Electrostatic Force Microscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33983

Title:	Study of Charge Diffusion at the Carbon Nanotube-SiO2 Interface by Electrostatic Force Microscopy
Authors:	Y He H G Ong Y Zhao S He L-J Li J L Wang
Issue Date:	2009
Relation:	JOURNAL OF PHYSICAL CHEMISTRY C 113, 15476
URI:	http://ir.sinica.edu.tw/handle/201000000A/33983
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1932-7447&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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