http://ir.sinica.edu.tw/handle/201000000A/33566
題名: | Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C60+ and Ar+ Co-Sputtering | 作者: | Yu, Bang-Ying Chen, Ying-Yu Wang, Wei-Ben Hsu, Mao-Feng Tsai, Shu-Ping Lin, Wei-Chun Lin, Yu-Chin Jou, Jwo-Huei Chu, Chih-Wei Shyue, Jing-Jong |
公開日期: | 2008-03-01 | 關聯: | ANALYTICAL CHEMISTRY 80, 3412 | URI: | http://ir.sinica.edu.tw/handle/201000000A/33566 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2700&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
顯示於: | 應用科學研究中心 |
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