Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C60+ and Ar+ Co-Sputtering

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33566

Title:	Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C60+ and Ar+ Co-Sputtering
Authors:	Yu, Bang-Ying Chen, Ying-Yu Wang, Wei-Ben Hsu, Mao-Feng Tsai, Shu-Ping Lin, Wei-Chun Lin, Yu-Chin Jou, Jwo-Huei Chu, Chih-Wei Shyue, Jing-Jong
Issue Date:	2008-03-01
Relation:	ANALYTICAL CHEMISTRY 80, 3412
URI:	http://ir.sinica.edu.tw/handle/201000000A/33566
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2700&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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