Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33333

Title:	Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters
Authors:	Choi, S. G. Aspnes, D. E. Stoute, N. A. Kim, Y. D. Kim, H. J. Chang, Y. C. Palmstrøm, C. J.
Issue Date:	2008
Relation:	PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 884-7
URI:	http://ir.sinica.edu.tw/handle/201000000A/33333
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1862-6300&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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