http://ir.sinica.edu.tw/handle/201000000A/33333| DC Field | Value | Language |
|---|---|---|
| dc.contributor | 應用科學研究中心 | - |
| dc.contributor.author | Choi, S. G. | - |
| dc.contributor.author | Aspnes, D. E. | - |
| dc.contributor.author | Stoute, N. A. | - |
| dc.contributor.author | Kim, Y. D. | - |
| dc.contributor.author | Kim, H. J. | - |
| dc.contributor.author | Chang, Y. C. | - |
| dc.contributor.author | Palmstrøm, C. J. | - |
| dc.date.accessioned | 2020-10-20T02:54:51Z | - |
| dc.date.available | 2020-10-20T02:54:51Z | - |
| dc.date.issued | 2008 | - |
| dc.identifier.issn | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1862-6300&DestApp=JCR&RQ=IF_CAT_BOXPLOT | - |
| dc.identifier.uri | http://ir.sinica.edu.tw/handle/201000000A/33333 | - |
| dc.description.sponsorship | 應用科學研究中心 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 884-7 | - |
| dc.title | Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters | - |
| dc.type | journal article | - |
| dc.description.note | 已出版;[SCI];有審查制度;具代表性 | - |
| item.grantfulltext | none | - |
| item.cerifentitytype | Publications | - |
| item.openairetype | journal article | - |
| item.fulltext | no fulltext | - |
| item.languageiso639-1 | en | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| Appears in Collections: | 應用科學研究中心 | |
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