http://ir.sinica.edu.tw/handle/201000000A/33111
題名: | Effect of Co-sputtering and Sample Rotation on Improving C60+ Depth Profiling of Materials | 作者: | Liao, Hua-Yang Tsai, Meng-Hung Chang, Hsun-Yun You, Yun-Wen Huang, Chih-Chieh Shyue, Jing-Jong |
公開日期: | 2012 | 關聯: | ANALYTICAL CHEMISTRY 84 [21] 9318-9323 | URI: | http://ir.sinica.edu.tw/handle/201000000A/33111 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2700&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
顯示於: | 應用科學研究中心 |
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