The Influence of Interface Roughness on the Normal Incident Absorption of Quantum-Well Infrared Photodetectors

請用此 Handle URI 來引用此文件： http://ir.sinica.edu.tw/handle/201000000A/33084

題名:	The Influence of Interface Roughness on the Normal Incident Absorption of Quantum-Well Infrared Photodetectors
作者:	Chou, Shu-Ting Lin, Shih-Yen Yu, Bonnie Shyue, Jing-Jong Tseng, Chi-Che Chen, Cheng-Nan Wu, Meng-Chyi Lin, Wei
公開日期:	2009
關聯:	Thin Solid Films 517 [5] 1799-1802
URI:	http://ir.sinica.edu.tw/handle/201000000A/33084
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0040-6090&DestApp=JCR&RQ=IF_CAT_BOXPLOT
顯示於：	應用科學研究中心

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