http://ir.sinica.edu.tw/handle/201000000A/33084| Title: | The Influence of Interface Roughness on the Normal Incident Absorption of Quantum-Well Infrared Photodetectors | Authors: | Chou, Shu-Ting Lin, Shih-Yen Yu, Bonnie Shyue, Jing-Jong Tseng, Chi-Che Chen, Cheng-Nan Wu, Meng-Chyi Lin, Wei |
Issue Date: | 2009 | Relation: | Thin Solid Films 517 [5] 1799-1802 | URI: | http://ir.sinica.edu.tw/handle/201000000A/33084 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0040-6090&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
| Appears in Collections: | 應用科學研究中心 |
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