| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2016 | Improvement of the Gas Cluster Ion Beam- (GCIB)-Based Molecular Secondary Ion Mass Spectroscopy (SIMS) Depth Profile with O2+ Cosputtering | Yi-Hsuan Chu; Hua-Yang Liao; Kang-Yi Lin; Hsun-Yun Chang; Wei-Lun Kao; Ding-Yuan Kuo; Yun-Wen You; Kuo-Jui Chu; Chen-Yi Wu; Jing-Jong Shyue | ANALYST 141(8), 2523-2533 |
