| Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 1999 | X-ray-absorption of Si-C-N thin films: a comparison between crystalline and amorphous phases | Chang, Y. K.; Hsieh, H. H.; Pong, W. F.; Tsai, M. H.; Dann, T. E.; Chien, F. Z.; Tseng, P. K.; Chen, L. C.; Wei, S. L.; Chen, K. H.; Wu, J. J.; Chen, Y. F. | JOURNAL OF APPLIED PHYSICS 86, 5609-5613 |
