公開日期 | 題名 | 作者 | 關聯 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2009 | The Influence of Interface Roughness on the Normal Incident Absorption of Quantum-Well Infrared Photodetectors | Chou, S. T.; Lin, S. Y.; Yu, Bonnie; Shyue, J. J.; Tseng, C. C.; Chen, C. N.; Wu, M. C.; Lin, W. | Thin Solid Films vol. 517, no. 5, pp. 1799–1802 |