The Influence of Interface Roughness on the Normal Incident Absorption of Quantum-Well Infrared Photodetectors

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/33690

Title:	The Influence of Interface Roughness on the Normal Incident Absorption of Quantum-Well Infrared Photodetectors
Authors:	Chou, S. T. Lin, S. Y. Yu, Bonnie Shyue, J. J. Tseng, C. C. Chen, C. N. Wu, M. C. Lin, W.
Issue Date:	2009-01-01
Relation:	Thin Solid Films vol. 517, no. 5, pp. 1799–1802
URI:	http://ir.sinica.edu.tw/handle/201000000A/33690
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0040-6090&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	應用科學研究中心

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