Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
2010 | InAs critical-point energies at 22 K from spectroscopic ellipsometry | Kim, T. J.; Yoon, J. J.; Hwang, S. Y.; Jung, Y. W.; Ghong, T. H.; Kim, Y. D.; Kim, H. J.; Chang, Y. -C. | Appl. Phys. Lett. 97, 171912 | | | |
2009 | Interband transitions of InAsxSb1−x alloy films | Kim, T. J.; Yoon, J. J.; Hwang, S. Y.; Aspnes, D. E.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Song, J. D. | Appl. Phys. Lett. 95, 111902-4 | | | |
2010 | Optical metrology of randomly-distributed Au colloids on a multilayer film | Hsu, S. -H.; Chang, Y. -C.; Chen, Y. -C.; Wei, P. -K.; Kim, Y. D. | Optics Express 18, 1310-1315 | | | |
2008 | Optical nanometrology of Au nanoparticles on a multilayer film | Chang, Y. C.; Hsu, S. H.; Kim, Y. D. | Phys. Stat. Sol.(c) 5, 1194-7 | | | |
2008 | Optical Properties of GaN by Using Ellipsometry and a Band Calculation | Kim, T. J.; Byun, J. S.; Kim, Y. D.; Kim, H.; Chang, Y-C | J. Korean Phys. Soc. 53, 1575-1579 | | | |
1994 | Optical Properties of the Zincblende CdSe and ZnxCd1-xSe films grown on GaAs | Kim, Y. D.; Klein, M. V.; Ren, S. F.; Chang, Y. C.; Luo, H.; Samarth, N.; Furdyna, J. K. | PHYSICAL REVIEW B 49, 7262 | | | |