Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2010 | InAs critical-point energies at 22 K from spectroscopic ellipsometry | Kim, T. J.; Yoon, J. J.; Hwang, S. Y.; Jung, Y. W.; Ghong, T. H.; Kim, Y. D.; Kim, H. J.; Chang, Y. -C. | Appl. Phys. Lett. 97, 171912 |