Steady-State Characterization for Capture and Escape Lifetimes of 2-D Electron Gas in Light-Emitting Transistors

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/88077

Title:	Steady-State Characterization for Capture and Escape Lifetimes of 2-D Electron Gas in Light-Emitting Transistors
Authors:	Yang, Lucas Chang, Shu-Wei Wu, Chao-Hsin
Issue Date:	2023
Relation:	IEEE Transactions on Electron Devices 70(7), 3675-3683
URI:	http://ir.sinica.edu.tw/handle/201000000A/88077
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0018-9383&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	http://dx.doi.org/10.1109/ted.2023.3279055
Appears in Collections:	應用科學研究中心

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