Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/49141

Title:	Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy
Authors:	C.L. Dong K. Asokan C.L. Chang C.L. Chen P.C. Lee P.C. Chen Y.Y. Chen J.F. Lee J.-H. Guo
Issue Date:	2006-03
Relation:	JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 152, 1-5
URI:	http://ir.sinica.edu.tw/handle/201000000A/49141
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0368-2048&DestApp=JCR&RQ=IF_CAT_BOXPLOT
URL:	http://www.sciencedirect.com/science/article/pii/S0368204806000053?np=y
Appears in Collections:	物理研究所

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