http://ir.sinica.edu.tw/handle/201000000A/45541| Title: | Astigmatic Detection System Based Atomic Force Microscope | Authors: | Hwu, En-Te Chen, Ching-Hsiu Huang, Kuang-Yuh Hwang, Ing-Shouh |
Issue Date: | 2012-11-01 | Conference: | 10th Cross-Strait Conference on Electron Microscopy (Lijiang, China : Electron Microscopy Community) | URI: | http://ir.sinica.edu.tw/handle/201000000A/45541 |
| Appears in Collections: | 物理研究所 |
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