New Optical scheme for Monitoring Three-Dimensional displacement of Probe in Atomic Force Microscope

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/45534

Title:	New Optical scheme for Monitoring Three-Dimensional displacement of Probe in Atomic Force Microscope
Authors:	Hwu, En-Te Huang, Kuang-Yuh Hung, Shao-Kang Hwang, Ing-Shouh
Issue Date:	2006-09-01
Conference:	The 16th International Microscopy Congress (IMC16) (Sapporo, Japan : IMC)
URI:	http://ir.sinica.edu.tw/handle/201000000A/45534
Appears in Collections:	物理研究所

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