散射式掃描近場光學顯微鏡—次十奈米級光學檢測 | Scholars Hub of the Academia Sinica

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/43325

Title:	散射式掃描近場光學顯微鏡—次十奈米級光學檢測
Authors:	朱仁佑汪天仁張祐嘉葉吉田王俊凱
Issue Date:	2008-04-01
Relation:	科儀新知 163，頁35-45
URI:	http://ir.sinica.edu.tw/handle/201000000A/43325
Appears in Collections:	原子與分子科學研究所

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