Wavelet-based method for time-domain noise analysis and reduction in a frequency-scan ion trap mass spectrometer

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/42988

Title:	Wavelet-based method for time-domain noise analysis and reduction in a frequency-scan ion trap mass spectrometer
Authors:	Chou, S. -W. Shiu, G. -R. Chang, H. -C. Peng, W. -P.
Issue Date:	2012
Relation:	JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY 23, 1855–1864
URI:	http://ir.sinica.edu.tw/handle/201000000A/42988
ISSN:	http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=1044-0305&DestApp=JCR&RQ=IF_CAT_BOXPLOT
Appears in Collections:	原子與分子科學研究所

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