Probabilistic Evaluations of Event-Tree and Fault-Tree in Safety-Critical Systems

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/36194

Title:	Probabilistic Evaluations of Event-Tree and Fault-Tree in Safety-Critical Systems
Authors:	Cho, Chi-Shiang Dai, Shih-Yao Chung, Wei-Ho Kuo, Sy-Yen
Issue Date:	2010-12-01
Conference:	4th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM 2010) (Wellington, New Zealand : Victoria University)
URI:	http://ir.sinica.edu.tw/handle/201000000A/36194
Appears in Collections:	資訊科技創新研究中心

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