http://ir.sinica.edu.tw/handle/201000000A/34251
Title: | Improvement of the Gas Cluster Ion Beam- (GCIB)-Based Molecular Secondary Ion Mass Spectroscopy (SIMS) Depth Profile with O2+ Cosputtering | Authors: | Yi-Hsuan Chu Hua-Yang Liao Kang-Yi Lin Hsun-Yun Chang Wei-Lun Kao Ding-Yuan Kuo Yun-Wen You Kuo-Jui Chu Chen-Yi Wu Jing-Jong Shyue |
Issue Date: | 2016 | Relation: | ANALYST 141(8), 2523-2533 | URI: | http://ir.sinica.edu.tw/handle/201000000A/34251 | ISSN: | http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Drexel&SrcApp=hagerty_opac&KeyRecord=0003-2654&DestApp=JCR&RQ=IF_CAT_BOXPLOT |
Appears in Collections: | 應用科學研究中心 |
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