GraphRSim: A Joint Device-Algorithm Reliability Analysis for ReRAM-based Graph Processing

Please use this identifier to cite or link to this item: http://ir.sinica.edu.tw/handle/201000000A/81485

Title:	GraphRSim: A Joint Device-Algorithm Reliability Analysis for ReRAM-based Graph Processing
Authors:	Chin-Fu Nien Yi-Jou Hsiao Hsiang-Yun Cheng Cheng-Yu Wen Ya-Cheng Ko Che-Ching Lin
Issue Date:	2020-03-09
Conference:	IEEE/ACM Design, Automation and Test in Europe Conference (DATE) (Virtual Conference : IEEE/ACM)
URI:	http://ir.sinica.edu.tw/handle/201000000A/81485
URL:	https://ieeexplore.ieee.org/abstract/document/9116232
Appears in Collections:	資訊科技創新研究中心

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